A Hybrid Crack Detection Approach for Scanning Electron Microscope Image Using Deep Learning Method

Abstract The scanning electron microscope (SEM) is widely used in the analysis and research of materials, including fracture analysis, microstructure morphology, and nanomaterial analysis. With the rapid development of materials science and computer vision technology, the level of detection technology is constantly improving. In this paper, the deep learning method is used to intelligently identify […]

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